Volume 2, Issue 2

Volume 2, Issue 2 - 2026

Open AccessPerspective

A Comprehensive AI Security Pipeline: Drift Detection, Adversarial Robustness and Automated ML Testing

Siddharth Kumar, Siddhanth Harish Bist

2026, 2(2): 13. doi: 10.53941/aieng.2026.100013

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Open AccessArticle

Open-Set Semiconductor Defect Classification in SEM Images via Uncertainty-Aware Local Prototype Alignment

Xinyi Yuan, Sisi Chen, Boran Hu, Yikang Zhou, Aohan Mei, Nan Li

2026, 2(2): 12. doi: 10.53941/aieng.2026.100012

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