Scilight Press

Author Information

Received: 28 Sep 2026 | Revised: 08 Oct 2026 | Accepted: 08 Oct 2026 | Published: 13 Oct 2026

Abstract

Keywords

condition monitoring | DC-link capacitors | end of life | failure time scales | fault pre-warning | operation optimization | power semiconductor devices | prognostics and health management (PHM) | remaining useful life (RUL) | verification

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