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AI Engineering
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Open-Set Semiconductor Defect Classification in SEM Images via Uncertainty-Aware Local Prototype Alignment
Xinyi Yuan, Sisi Chen, Boran Hu, Yikang Zhou, Aohan Mei, Nan Li
2026, 2(2): 12. doi: 10.53941/aieng.2026.100012
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Wireless Localization Using Deep Learning: A Survey
Hongtao Xia, Matthew Andrews, Andrea Conti, Victor Lawrence, Moe Z. Win, Yu-Dong Yao
2026, 2(1): 1. doi: 10.53941/aieng.2026.100001
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Open AccessArticle
On Wide-Band Oscillation Localization in Power Transmission Grids: Explainability and Improvement
Yuyou Li, Jie Gu, Jiaqing Wu, Zhijian Jin, Honglin Wen
2025, 1(1): 2. doi: 10.53941/aieng.2025.100002
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