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Open-Set Semiconductor Defect Classification in SEM Images via Uncertainty-Aware Local Prototype Alignment

Xinyi Yuan, Sisi Chen, Boran Hu, Yikang Zhou, Aohan Mei, Nan Li

2026, 2(2): 12. doi: 10.53941/aieng.2026.100012

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Wireless Localization Using Deep Learning: A Survey

Hongtao Xia, Matthew Andrews, Andrea Conti, Victor Lawrence, Moe Z. Win, Yu-Dong Yao

2026, 2(1): 1. doi: 10.53941/aieng.2026.100001

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Open AccessArticle
On Wide-Band Oscillation Localization in Power Transmission Grids: Explainability and Improvement

Yuyou Li, Jie Gu, Jiaqing Wu, Zhijian Jin, Honglin Wen

2025, 1(1): 2. doi: 10.53941/aieng.2025.100002

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